Article No. 62111
Microscopy - Scanning electron microscope (SEM/EDS) assesment
Examination of thin sections, polished sections, fractured and scattered specimens by SEM/EDS. Montage and sputter coating for SEM-analysis included.
Examination of thin sections, polished sections, fractured and scattered specimens by SEM/EDS. Montage and sputter coating for SEM-analysis included.